當前位置：深圳市萬騰通科技有限公司>>誤碼儀>>Agilent/HP 71612B 誤碼分析儀

Agilent/HP 71612B 誤碼分析儀

返回列表頁

參考價

面議

具體成交價以合同協議為準

產品型號

品牌

廠商性質其他

所在地

在線詢價收藏產品查看聯系電話

聯系方式：查看聯系方式

更新時間：2022-07-05 15:10:04瀏覽次數：196次

聯系我時，請告知來自智慧城市網

產品分類 品牌分類

  誤碼儀

全部產品列表

暫無信息

深圳市萬騰通科技有限公司

經營模式：其他

商鋪產品：447條

所在地區：

詢價 給他留言

產品簡介

產品 ID： 11854 產品品牌： 42 產品型號： ......

詳細介紹

The Agilent 71612B Gbit tester is used to measure bit error ratio (BER) and to verify the performance and quality of your components and system hardware. The analyzer operates from 1 to 12Gb/s and will operate down to 100Mb/s with a clock-source extension.

The Agilent 71612B error performance analyzer is available with pattern generator, error detector and integral 12 GHz clock source.

The Agilent 71612B error performance analyzer can be used with optional low-rate clock. For high-performance pattern generation and error analysis across the entire 100 Mb/s to 12 Gb/s range.

The 71612B accurately characterizes Gbit systems and devices such as Lightwave submarine cable systems, SONET/SDH synchronous network transmitters and receivers, Gbit datacom serial links, Lasers and photodetectors, High-speed logic devices, optical amplifiers and Modulators, Decision circuits, Multiplexers and output drivers.

Exceptional waveform performance (even with reflective or poor terminations).
Display maybe totally dedicated to pattern editing.
Error location analysis identifies individual errored bits in custom patterns; measure bit, block or.
total pattern BER.
Flexible pattern trigger allows oscilloscope to be triggered on any bit in custom pattern, allowing errored bits to be displayed on oscilloscope.
Cost effective addition of 12 Gb/s jitter analysis with the Agilent 71501C jitter analyzer.
Eye line display with Agilent 83480A communications analyzer.
Q measurement and eye-contour analysis with Agilent E4543A application software.
Test patterns.
Zero substitution.
Variable mark density ratio on patterns.
STM-64 and STS-192 Samples supplied on disk.
Measurements.
Clock frequency.
Error location analysis.